An inspection system inspects appearances of a plurality of worked
products held by a sheet-like inspection target sheet, and includes an
image processing station provided at a first location and defect
detection stations provided at one or a plurality of second locations
away from the first location. The appearance inspection system includes a
marking station. The image processing station images each of the worked
products held by the inspection target sheet and extracts image-processed
data serving as an inspection target. The defect detection station
displays on a computer the image-processed data to urge an operator to
detect a defect part, and outputs detection result data including
position data on the defect part, based on an instruction from the
operator. The marking station gives onto the image-processed inspection
target sheet a mark representing the defect part, based on the detection
result data output by the defect detection station.