The present invention contemplates a variety of methods and techniques for
fabricating an improved carbon nanotube (CNT) device such as an AFM
probe. A CNT is first formed on a desired location such as a substrate.
The CNT and substrate are then covered with a protective layer through a
CVD or other suitable process. Then a length of the CNT is exposed
through etching or other suitable process, the exposed length being
formed to a length suitable for a desired application for the CNT device.