A potential which is applied to a gate electrode of a driving transistor
in accordance with an emission state or a non-emission state of a
light-emitting element fluctuates due to noise or leakage from a
selection transistor, or the like, which causes a problem in that the
driving transistor cannot turn on or off normally and malfunctions. The
present invention includes a transistor connected to a light-emitting
element, a power source line, a scan line, a memory circuit, and a
switching circuit, in which the transistor controls light emission or non
light emission of the light-emitting element, and the switching circuit
controlled by the scan line conducts switching between the transistor,
and the memory circuit and the power source line, and applies an input
potential to the transistor.