Provided is an apparatus and method for remote retrieval of an integrated-circuit state according to the present invention uses a remote input/output ("RIO") processor with a test circuit interface, which in the preferred embodiment is the TAP 118. The test circuit interface is for electrically-coupling to an integrated circuit having a test circuit with at least one register for storing a state-information with respect to the integrated circuit. The RIO processor executes a program that instructs the RIO processor to retrieve the state-information in response to a request command. The retrieved state information is transmitted for analysis at a location remote from the computer system using a data-and-instruction communication device. A method of the present invention has a step of issuing a request command for state-information of the integrated circuit having, retrieving the state-information of the integrated circuit in response to the command request; and transmitting the state-information to a location remote from the integrated circuit such that the state-information is available for analysis by a service technician.