A method of testing a reflection-type LCD projector is disclosed. The present invention provides a method of testing the digital-circuit portion of the data drivers of the silicon wafer LCD of the reflection-type LCD projector, and a method of testing the panel pixel area of the silicon wafer LCD display. The present invention can be applied to LCD display panels manufactured by CMOS process and polysilicon thin film transistor process for the benefits of helping to resolve manufacturing issues during the development stage, thereby shortening the required production time schedule, and reducing the production cost.