A vision comparison inspection system is disclosed for use in a printed circuit assembly production line having a plurality of component processing locations and a conveyor system for transporting circuit assemblies between processing locations in an upstream to downstream work flow direction. The vision comparison inspection system includes a printed circuit assembly image capture and inspection conveyor disposed in the production line, the image capture and inspection conveyor being adapted to receive printed circuit assemblies from an upstream portion of the production line and to transport the printed circuit assemblies to a downstream portion of the production line for subsequent processing. An electronic imaging device is fixedly positioned to capture an image of a printed circuit assembly located on the image capture and inspection conveyor. A lighting system is mounted for illuminating a printed circuit assembly located in the field of view of the imaging device. A position control system positions a printed circuit assembly within the field of view of the imaging device. An imaging control system including a programmed image processing computer, an input device, and an electronic display device presenting a graphical user interface are provided for alternatingly displaying on the display device a stored image of a known good printed circuit assembly and an image of a printed circuit assembly under test, whereby defects in the printed circuit assembly under test can be visually identified.