A probe for a circuit board tester as well as to an adapter and a circuit
board tester. The probe comprises a needle and a sleeve, the needle being
shiftingly guided in the sleeve and the needle protruding at least 10 mm
from the sleeve, more particularly more than 20 mm. In one embodiment, the
needle is conically tapered to a contact tip at least in a portion
protruding from the sleeve. With the probe in accordance with the
invention, adapters for circuit boards can be produced comprising contacts
in high-density, the probes simultaneously acting resiliently.
