A universal electromagnetic resonance system is aimed at detecting and
measuring local non-uniformities in objects made from conductive or
non-conductive materials. The system comprises a composite measuring unit
composed of two identical and symmetrically arranged individual
oscillation circuits with measurement elements in the form of identical
and symmetrically arranged inductive coils or capacitor chips. The unit is
connected to an impedance analyzer for supplying RF current and for
measuring the voltage signal in the oscillation circuit. Since all the
elements of individual oscillation circuits are identical, in the case of
non-uniformity of the object on the scanned area, the parameters of the
resonance will hanged. This change will violate the symmetry in the
operation of the individual oscillation circuits. The variation in
measured signal can be calibrated in terms of the target parameter or
characteristic of the object.
