A method and program-load circuit is for regulating the voltages at the
drain and body terminals of a non-volatile memory cell being programmed.
These voltages are applied from a program-load circuit connected in a
conduction pattern to transfer a predetermined voltage value to at least
one terminal of the memory cell. The method includes a step of regulating
the voltage value locally, within the program-load circuit, to overcome
the effect of a parasitic resistor present in the conduction pattern.