The invention relates to a test apparatus for the checking of the exposure
quality of an exposed film, in particular of a motion film. A test pattern
holder serves for the holding of a test pattern of the exposed film. A
reference pattern with at least one reference mark is provided in
superimposition with respect to the test pattern held by the test pattern
holder. A light transmitter serves for the illumination of the test
pattern held by the test pattern holder and of the reference pattern
superimposed herewith. A light receiver is provided for the reception of
the light transmitted through the reference pattern and through the test
pattern and for the generation of corresponding electrical received
signals. An evaluation device evaluates these received signals with
respect to at least one quality parameter. The invention furthermore
relates to a corresponding test method.
