A plurality of measuring units each comprising a dielectric block, a metal
film layer which is formed on a surface of the dielectric block and a
sample holder are supported on a support. The support is moved by a
support drive means to bring in sequence the measuring units to a
measuring portion comprising an optical system which projects a light beam
emitted from a light source, and a photodetector which detects attenuation
in total internal reflection by detecting the intensity of the light beam
which is reflected in total internal reflection at the interface between
the dielectric block and the metal film layer. In this measuring
apparatus, lots of samples can be measured in a short time.
