The present invention is a method, system, and product for testing operating
characteristics of a continuous-time or discrete-time device under test, which
is included within a circuit. The operating characteristics of the continuous-time
or discrete-time device are tested utilizing electronic components that already
exist within the circuit such that a test circuit is not utilized to test the device.
The circuit includes a variable gain amplifier and an automatic gain correction
(AGC) circuit. The operating characteristics of the device are tested utilizing
the variable gain amplifier and said AGC circuit.
