An X-ray inspection system includes an X-ray source that generates more than
one
beam defining an inspection plane, the beams being substantially parallel to each
other; an X-ray detector having a plurality of detector arrays, each of which is
aligned with one of the beams, and structure for supporting an object between the
X-ray source and the X-ray detector. The X-ray source includes an electron gun
and a device for steering an electron beam generated by the gun to multiple focal
spots on a target.
