Fault indicator with automatically configured trip settings

   
   

A fault indicator for indicating the occurrence of a fault in an electrical conductor has a housing, a high capacity battery, a display for indicating the occurrence of a fault, a current sensor for sensing the load current in a monitored conductor a microcontroller for determining the load current, for selecting one of a plurality of trip settings, such as in several steps between 50 A and 1200 A, based upon the determined load current and for determining that a fault condition occurred when the load current exceeds the trip setting. The selected trip setting is stored in memory. The load current is periodically sampled and the trip setting is changed if the load current falls in a different range. The display may include permanent and temporary fault indicating LEDs and additional internal LEDs that cause the housing to glow or flash at nighttime, or a target style display may be used. Upon the load current exceeding the trip setting, the microcontroller begins flashing the permanent fault LEDs. After a predetermined interval, the microcontroller again senses the load current. If the current is zero, the fault is permanent and the permanent LEDs continue to flash until a timed reset occurs. If load current is present, the fault is temporary and the temporary LED is flashed. If the load current remains above the trip setting, the load had increased and the microcontroller sets a new trip setting. Related methods are also disclosed.

 
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