A method and device for measuring thermoelectric characteristics of a combinatorial
sample. The method and device are useful for rapid sample evaluation, the investigation
of thermoelectric materials, and the carrier control of semiconductors. The device
includes combinatorial samples patterned with a metal mask, a pair of sample holders
for applying a small temperature gradient to the sample, a thermocouple for measuring
the temperature gradient, and a probe pin array in contact with the sample.
