A system and method for generating random noise for use in testing electronic
devices
comprises a first random pattern generator circuit for generating first sets of
random bit pattern signals; one or more delay devices each receiving a trigger
input signal and a random bit pattern signal set for generating in response a respective
delay output signal, each delay output signal being delayed in time with respect
to a respective trigger signal, a delay time being determined by the bit pattern
set received; and, an oscillator circuit device associated with a respective one
or more delay devices for receiving a respective delay output signal therefrom
and generating a respective oscillating signal, each oscillator signal generated
being used to generate artificial random noise for emulating a real noise environment
in an electronic device. A second random pattern generator circuit may be provided
for generating second sets of random bit pattern signals for receipt by each of
the associated oscillator circuit devices in order to frequency adjust in a random
manner, each of the oscillator signals.
