An electronic memory device tester has an input arranged to receive seed data
with a first number (p) of seed data bits from a computer and a data generator
arranged to receive an array of prepared data having a second number (q) of prepared
data bits, where qp, and arrange to generate from the prepared data a test
data pattern for writing to an electronic memory device to be tested. The tester
generates its own test pattern thus relieving the computer processor from that
task. This in turn allows the computer to control the test cycle itself without
compromising the test speed.
