Contact structure and production method thereof and probe contact assembly using same

   
   

A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors attached to a contactor carrier. The contactors are inserted in diagonal through holes on the contactor carrier and attached to the contactor carrier through adhesives. The contactor has a top end having a flat top surface, a straight diagonal beam integral with the top end and configured by an upper beam portion and a lower beam portion, and a lower end at an end of the lower beam portion to contact with a contact target. A length of the upper beam portion and a length of the lower beam portion are about the same. A probe contact assembly using the contact structure is also disclosed which incorporates a flip chip bonding technology to interconnect the components therein.

 
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