A host system for generating a software built-in self-test engine (SBE) is provided
for enabling on-chip generation and application of a re-generative functional test
on a complex device such as a microprocessor under test. The host system comprises
user directives provided to indicate user desired actions; instruction information
provided to define a suite of instructions; and a SBE generation tool arranged
to generate a software built-in self-test engine (SBE) based on the user directives,
the instruction information and device constraints, for subsequent storage on-board
of a complex device such as a microprocessor under test and activation of a re-generative
functional test on the complex device under test (DUT).
