To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data line 6 to turn on a switching transistor 4 for a prescribed time, a holding capacitor 3 and a parasitic capacitor 8 are charged. By turning on again the switching transistor 4 after a lapse of a prescribed time from turning-off of the switching transistor 4 and by connecting the data line 6 to an integrator 10, the holding capacitor 3 and the parasitic capacitor 8 are discharged, and a discharged amount of charge is detected by the integrator 10. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.