A method and an apparatus for implementing enhancing data population based upon manufacturing data. A first and a second workpiece are processed. Metrology data relating to the first workpiece is acquired. The metrology data is extrapolated to generate representative metrology data relating to the second workpiece.

 
Web www.patentalert.com

< Method for manufacturing a FBG having improved performances and an annealing-trimming apparatus for making the same

< Semiconductor device and manufacturing method thereof

> Method and components for flip-chip bonding

> Semiconductor wafer inspection system
~ 00214