A light emitting diode is provided having a Group III nitride based superlattice
and a Group III nitride based active region on the superlattice. The active region
has at least one quantum well structure. The quantum well structure includes a
first Group III nitride based barrier layer, a Group III nitride based quantum
well layer on the first barrier layer and a second Group III nitride based barrier
layer. A Group III nitride based semiconductor device and methods of fabricating
a Group III nitride based semiconductor device having an active region comprising
at least one quantum well structure are provided. The quantum well structure includes
a well support layer comprising a Group III nitride, a quantum well layer comprising
a Group III nitride on the well support layer and a cap layer comprising a Group
III nitride on the quantum well layer. A Group III nitride based semiconductor
device is also provided that includes a gallium nitride based superlattice having
at least two periods of alternating layers of InXGa1-XN and
InYGa1-YN, where 0X1 and 0Y1
and X is not equal to Y. The semiconductor device may be a light emitting diode
with a Group III nitride based active region. The active region may be a multiple
quantum well active region.