A device apparatus and method are detailed that allow for improved bit error rate (BER) testing, configuration, and operation of a communication device and associated physical communication link, in particular on a HDSL communication device and link. The improved communication device apparatus and method additionally allow for the communication device to utilize an embedded BER tester (BERT) to run commonly utilized BER tests on high speed communication channels (downstream and upstream) associated with the communication device. The device apparatus and method also allow for a BER test to be configured and initiated remotely, with loopback at a remote device and masking of alarm states at the remote device or local device until the BER test is complete.