A system and method for detecting chamber leakage by measuring the reflectivity
of an oxidized thin film. In a preferred embodiment, a method of detecting leaks
in a chamber includes providing a first monitor workpiece, placing the first monitor
workpiece in the chamber, and forming at least one film on the first monitor workpiece.
The reflectivity of the least one film of the first monitor workpiece is measured,
wherein the reflectivity indicates whether there are leaks in the at least one
seal of the chamber. In another embodiment, the method includes providing a second
monitor workpiece, placing the second monitor workpiece in the chamber, and forming
at least one film on the second monitor workpiece. The reflectivity of the at least
one film of the second monitor workpiece is measured, and the second monitor workpiece
film reflectivity is compared to the first monitor workpiece film reflectivity.