The present invention concerns a method of forming one or more thin films on
a substrate by depositing two or more materials by vacuum evaporation, comprising,
depositing each material under such control that ni value of the each material
is k0.5 wherein k is a constant from 2 to 5, when relationship between a
deposition position and a film thickness of a material i on the substrate is approximated
by the following equation (1):
Di/D0i(L0/Li)3cosnii (1)
wherein L0 is a distance from an evaporation source to a plane
of the substrate in a perpendicular direction, D0i is a film thickness
of the material i at an intersection point of a perpendicular line from the evaporation
source to the plane of the substrate, and Di is a film thickness of
the material i at a position on the substrate which is apart from the evaporation
source by a distance Li in a direction of an angle i against
the perpendicular line. By the method, a homogenous thin film layer for an element
can be formed even on a substrate having large screen.