A list of waveforms is received (the list being one that is to be driven to or
received from a pin of a device under test). The list of waveforms is de-interleaved
to form lists of non-interleaved waveforms. Each list of non-interleaved waveforms
is then optimized by combining at least two of its entries. By way of example,
the above method may be implemented by program code stored on a number of computer
readable media, or by a circuit tester having program code for implementing same.