A method for forming a copper bump for flip chip bonding having improved oxidation resistance and thermal stability including providing a copper column having a thickness of at least about 40 microns overlying a metallurgy including an uppermost copper metal layer and a lowermost titanium layer the lowermost titanium layer in contact with an exposed copper bonding pad portion surrounded by a passivation layer; and, selectively depositing at least one protective metal layer over the copper column according to an electrolytic deposition process.