A method and system for predicting manufacturing yield for a proposed integrated
circuit The method includes: in the order recited: (a) providing a multiplicity
of different integrated circuit library elements in a design database, each library
element linked to a corresponding normalization factor in the design database;
(b) selecting library elements from the design database to include in a proposed
design for the integrated circuit; (c) generating an equivalent circuit count of
the proposed design based on the normalization factors and a count of each different
library element included in the proposed design; and (d) calculating a predicted
manufacturing yield based on the equivalent circuit count, a predicted density
of manufacturing defects and an area of the proposed integrated circuit chip.