The present invention concerns a method and an arrangement for imaging and measuring
microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional
form on a display (27) associated with the microscope. At least one arbitrary
section position and an arbitrary rotation angle are defined by the user. Rotation
of the three-dimensional depiction on the display (27) is performed until
a structure contained in the three-dimensional form reproduces on the display (27)
a depiction that appears suitable to the user. The corresponding analytical operations
are then performed on the structure.