A scanning line driver circuit is provided that can narrow intervals of its scanning lines to values exceeding the limitation value of its output pitch without harming the versatility of a data line driver circuit. A first scanning control signal generation circuit can generate a first scanning control signal for scan-driving a first group of scanning lines, and a second scanning control signal generation circuit can generate a second scanning control signal for scan-driving a second group of scanning lines. A selection output circuit can select and output one of the first scanning control signal and the second scanning control signal as a scanning control signal based on positional information inputted from a data line driver circuit. A scanning driving circuit can supply scanning signals for scan-driving to the respective scanning lines based on the scanning control signal that has been selected and outputted.

 
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> Semiconductor memory device for storing multivalued data

> Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used
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