A method for manufacturing and grading OLED devices is described, comprising the steps of: a) manufacturing OLED devices having a plurality of pixels; b) measuring pixel brightness and uniformity variation of each of the OLED devices prior to burning-in the OLED devices; c) correcting the pixel brightness and uniformity variation of each of the OLED devices prior to burning-in the OLED devices; d) grading each of the corrected OLED devices prior to burning-in the OLED devices; e) burning-in OLED devices graded as acceptable prior to burning-in the OLED devices; f) measuring burned-in pixel brightness and uniformity variation of each of the burned-in OLED devices; g) re-correcting the pixel brightness and uniformity variation of each of the burned-in OLED devices; and h) grading each of the re-corrected, burned-in OLED devices. The present invention has the advantage of providing improved yields in manufacture of OLED displays having acceptable uniformity and thereby reducing the cost of manufacturing an OLED display.