A scan path flip-flop so adapted that the value of the flip-flop will not be changed by set and reset signals at the time of a shift operation is provided. The scan path flip-flop includes a control terminal for receiving a control signal, which controls mode changeover between a scan path test mode and a normal operation mode; a set terminal for receiving a set signal; and a reset terminal for receiving a reset signal. A first OR gate is provided for inhibiting output of a signal at the set terminal and outputting a fixed value when the control signal is indicative of a scan path test. When the control signal is indicative of a scan path test, therefore, the flip-flop will not be set. A second OR gate is provided for inhibiting output of a signal at the reset terminal RESETB and outputting a fixed value when the control signal is indicative of the scan path test. When the control signal indicates the scan path test, therefore, the flip-flop will not be reset.