An input/output characterization register is provided for characterizing an integrated circuit input or output. The register includes a normal data input, a characterization data input, and a data latch having a latch control input, a latch data input and a latch data output. The normal data input and the characterization data input are multiplexed with the latch data output to the latch data input.

 
Web www.patentalert.com

< Test method and test circuit for electronic device

< Internal bus testing device and method

> Microprocessor on-chip testing architecture and implementation

> Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machine
~ 00251