A positive resist composition comprising (A) resin having a monocyclic or
polycyclic alicyclic hydrocarbon structure and capable of decomposing by
the action of an acid to increase the solubility in an alkaline
developer, (B) a compound capable of generating an acid upon treatment
with one of an actinic ray and radiation and (F) a specific surfactant
containing a fluorine atom in an amount of from 30 to 60 mass %, and a
pattern-forming method using the same.