A method of detecting a defect on a surface of a material due to exposure of the material to incident ionizing radiation, the method comprising the step of:

    • inspecting a solid material having an atomically flat surface by at least an Atomic Force Microscope (AFM) or a Magnetic Force Microscope (MFM) for a defect in atomic structure on said surface due to exposure to ionizing radiation.

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    > Method and apparatus for clock synchronization using quantum mechanical non-locality effects

    > Distributed biohazard surveillance system and apparatus for adaptive collection and particulate sampling
    ~ 00260