A method of predicting current boost levels and applying them to precharge current-driven elements in a matrix, and a method of manufacturing devices for this purpose. Elements are driven during successive scan cycles, each having a precharge period and an exposure period. One or more conduction voltages are sensed while an element conducts a selected current, either during a calibration cycle or during an exposure. A correct boost current is predicted from the conduction voltage(s) based upon other parameters including column capacitance, which may be determined upon manufacture, and the predicted boost current is then applied to matrix elements.