It is an object of the present invention to provide a semiconductor device
design method and program that can rapidly improve power supply noise
characteristics and reduce the noise sufficiently without being
restricted in design and noise solution. A step of performing frequency
analysis on a power supply distribution network model creates a power
supply distribution network model based on electric characteristics
obtained in accordance with specifications (maximum allowable drop value
of power supply voltage, power supply current value, operating frequency,
etc.) of the semiconductor device and performs frequency analysis on this
power supply distribution network model. A step of performing frequency
analysis based on an operating current waveform analyzes power supply
current characteristics based on an operating current waveform obtained
in accordance with the specification. A step of calculating power supply
noise calculates the power supply noise in accordance with analysis
results of the step of performing frequency analysis on the power supply
distribution network model and the step of performing frequency analysis
based on the operating current waveform. It is thus possible to estimate
the power supply noise before designing a circuit of the semiconductor
device.