The semiconductor device comprises an interconnection buried in an
interconnection groove formed in a lower insulating film, and an upper
insulating film having a contact hole formed down to an end part of the
interconnection. The interconnection groove is formed by using a design
pattern having a main interconnection portion 100 and an extended portion
104 provided at an end part of a main interconnection portion 100 for
forming the interconnection and extended perpendicularly to an extending
direction of the main interconnection portion 100.