A circuit for correction of white pixel defects capable of complementing
white pixel faults without using a storage device for holding white pixel
fault spots, and an image sensor using the circuit for correction of
white pixel defects. Pixels constituting a pixel section are sequentially
subjected to white pixel fault complementation process. A nearby pixel
data holding section acquires pixel data from a readout circuit and holds
the data. A comparison-determination section compares lightness of a
target pixel with that of a nearby pixel and determines, based on the
comparison result, whether or not the target pixel is associated with a
white pixel fault having a lightness higher than that of the nearby pixel
by a predetermined value or more. When it is judged by the
comparison-determination section that the target pixel is associated with
a white pixel fault, a complementary calculation section performs a
complementary calculation by using the pixel data of the target and
nearby pixels held by the nearby pixel data holding section, to generate
complemented data.