A terminal block probe for taking electrical current measurements through an isolating terminal block by a multi-meter includes a tip configured as an isolating terminal block pin corresponding to the isolating terminal block pin of the particular isolating terminal block under test. This allows the probe to be releasably held by the terminal block for hands free testing. The probe tip includes two conductors adapted for contact with the isolating pin terminals of the terminal block. The terminal block probe includes a socket that releasably receives a plug of a multi-meter cable. Internal wiring of the probe extends from the socket and connects with the two conductors of the tip. When the plug of the multi-meter cable is received within the socket, the conductors of the tip are in electrical continuity with the wires of the multi-meter cable and thus the multi-meter. A kit of a plurality of isolating terminal block probes each having a differently configured tip corresponding to differently configured isolating terminal block pins of different isolating terminal blocks is also provided. Each probe of the kit has a socket that accepts the same plug of the same multi-meter cable.

 
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> InGaN diode-laser pumped II-VI semiconductor lasers

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