A semiconductor package and substrate having multi-level plated vias provide a high density blind via solution at low incremental cost. Via are half-plated atop a circuit pattern and then a second via half is added to complete the via after isolation of elements of the circuit pattern. Successive resist pattern applications and etching are used to form a via tier atop a circuit pattern that is connected by a thin plane of metal. After the tier is deposited, the thin metal plane is etched to isolate the circuit pattern elements. Dielectric is then deposited and the top half of the via is deposited over the tier. The tier may have a larger or smaller diameter with respect to the other half of the via, so that the via halves may be properly registered. Tin plating may also be used to control the etching process to provide etching control.

 
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> Semiconductor device having a multilayer interconnection structure and fabrication process thereof

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