A system unit including a processor unit and an input storage unit. The processor unit generates an input signal and a clock signal. The input storage unit receives the input signal and the clock signal. The input storage unit processes the clock signal to generate an input buffer enable signal. The input buffer enable signal changes from an inactive state to an active state a short time interval before at least one of the transitions of the clock signal. A method includes receiving a clock signal having a plurality of transitions at an input buffer unit, enabling the input buffer unit before each of the plurality of transitions, and disabling the input buffer unit after each of the plurality of transitions.

 
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> Method and apparatus for testing embedded memory on devices with multiple processor cores

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