The invention, which relates to a wafer lifting device having a lifting platform arranged under a wafer receptacle, which lifting platform can be moved in the vertical direction and at least three pins which can be moved in through holes in the wafer receptacle. The pins are separately guided in the through holes. A pin is guided and held such that it can be moved longitudinally, and the pin guide is fixedly connected to the wafer receptacle.

 
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> Selecting groups of dies for wafer testing

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