A method for assessing a reliability of a complex component having a plurality of similar subcomponents is described. The complex component is divided into a plurality of component parts, each component part including at least one of the subcomponents. Specification ranges are identified for measured variables within which the component parts are considered to be operating within specification. The complex component is subjected to a reliability test and reliability data is obtained for the component parts by comparing the measured variable for each of the component parts with the specification ranges to determine failure times. A system and machine readable medium embodying program instructions is also provided.

 
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> Low threshold voltage PMOS apparatus and method of fabricating the same

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