A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C&D framework.

 
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> Method and structure to develop a test program for semiconductor integrated circuits

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