A system and method for semiconductor work-in-process (WIP) dispatch management. Information regarding multiple wafer lots to be processed in a process node is acquired. Which wafer lot requires processing prior to the other wafer lots is determined by analyzing a load of multiple successive process nodes for each wafer lot. The analyzed quantity of the load of the successive process nodes for each wafer lots is determined contingent upon a predetermined observation time period.

 
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> Interactive method of providing analysis of potency and purity of pharmaceutical compounds

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