A device for ellipsometric two-dimensional display of a sample placed in
an incident medium, observed between an analyser and a polarizer
intersected by convergent light reflection, wherein the ellipsometric
parameters of the assembly formed by the sample and a substrate whereon
it is placed, are used. The substrate comprises a support and a stack of
base layers and its ellipsometric properties are known. The ellipsometric
properties of the substrate are such that variations of the sample
ellipsometric parameters are displayed with contrast higher that the
contrast produced in the absence of the substrate. The invention also
concerns a display method and an ellipsometric measurement method with
spatial resolution.