A radiation hardened latch is presented. The radiation hardened latch uses two redundant inverter paths to duplicate an input signal. The duplicated inverter paths are coupled with a radiation hardened inverter that will only produce an inverted signal if both input signals have equivalent voltage levels. The radiation hardened inverter and its output signal produce a radiation hardened node that drives either one of the duplicated inverter paths back to an appropriate voltage level in the event of an SET. Because, the radiation hardened node and duplicated inverter paths are isolated, the latch may be optimized for factors such as signal speed and driving strength. These factors may be optimized without affecting radiation hardness. The radiation hardened latch may also be used to build more complex circuits such as a flip-flop.