The present invention provides automated kernel software outage measurement and classification. System failures are categorized into software-caused failures and hardware-caused failures. Software failures are further classified as unplanned outages and operational outages. The operational outages are then classified as unplanned operational outages and planned operational outages.

 
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> Pattern dimension correction method and verification method using OPC, mask and semiconductor device fabricated by using the correction method, and system and software product for executing the correction method
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