A system and method are disclosed for measuring signal crosstalk in an electronic circuit device or Integrated Circuit (IC) device, correlating the results with modeled information, and accurately identifying one or more levels of coupling noise in the device. For example, a system is disclosed that provides data on levels of crosstalk between conductive lines in a device. The system uses programmable victim and aggressor lines, programmable drive capability, and programmable loading through one or more known crosstalk structures to compare an output signal with a reference signal and accurately identify one or more levels of coupling noise in the device.